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· 제목 : VLSI Test Principles and Architectures: Design for Testability (Hardcover, New) (Design for Testability)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전기공학
· ISBN : 9780123705976
· 쪽수 : 808쪽
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전기공학
· ISBN : 9780123705976
· 쪽수 : 808쪽
목차
Chapter 1 ? Introduction
Chapter 2 ? Design for Testability
Chapter 3 ? Logic and Fault Simulation
Chapter 4 ? Test Generation
Chapter 5 ? Logic Built-In Self-Test
Chapter 6 ? Test Compression
Chapter 7 ? Logic Diagnosis
Chapter 8 ? Memory Testing and Built-In Self-Test
Chapter 9 ? Memory Diagnosis and Built-In Self-Repair
Chapter 10 ? Boundary Scan and Core-Based Testing
Chapter 11 ? Analog and Mixed-Signal Testing
Chapter 12 ? Test Technology Trends in the Nanometer Age
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