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· 제목 : Quantitative Atomic-Resolution Electron Microscopy: Volume 217 (Hardcover)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 신호/신호처리
· ISBN : 9780128246078
· 쪽수 : 294쪽
· 출판일 : 2021-04-07
· 분류 : 외국도서 > 기술공학 > 기술공학 > 신호/신호처리
· ISBN : 9780128246078
· 쪽수 : 294쪽
· 출판일 : 2021-04-07
목차
1. Introduction Sandra Van Aert 2. Statistical parameter estimation theory Sandra Van Aert 3. Efficient fitting algorithm Sandra Van Aert 4. Statistics-based atom counting Sandra Van Aert 5. Atom column detection Sandra Van Aert 6. Optimal experiment design for nanoparticle atom-counting from ADF STEM images Sandra Van Aert 7. Maximum a posteriori probability Sandra Van Aert 8. Discussion and conclusions Sandra Van Aert 9. Phase retrieval methods applied to coherent imaging Tatiana Latychevskaia
