책 이미지
책 정보
· 제목 : High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Hardcover, 2, 2004) 
· 분류 : 외국도서 > 기술공학 > 기술공학 > 나노테크놀리지/MEMS
· ISBN : 9780387400921
· 쪽수 : 408쪽
· 분류 : 외국도서 > 기술공학 > 기술공학 > 나노테크놀리지/MEMS
· ISBN : 9780387400921
· 쪽수 : 408쪽
목차
1 Elements for Designing an X-Ray Diffraction Experiment.- 2 Diffractometers and Reflectometers.- 3 Scans and Resolution in Angular and Reciprocal Space.- 4 Basic Principles.- 5 Kinematical Theory.- 6 Dynamical Theory.- 7 Semikinematical Theory.- 8 Determination of Layer Thicknesses of Single Layers and Multilayers.- 9 Lattice Parameters and Strains in Epitaxial Layers and Multilayers.- 10 Diffuse Scattering From Volume Defects in Thin Layers.- 11 X-Ray Scattering by Rough Multilayers.- 12 X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures.- 13 Strain Analysis in Periodic Nanostructures.- 14 X-Ray Scattering from Self-Organized Structures.- References.
추천도서
분야의 베스트셀러 >