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· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 전자현미경
· ISBN : 9780471248248
· 쪽수 : 516쪽
· 출판일 : 2000-12-05
목차
FUNDAMENTALS OF OPERATION.
Introduction (D. Bonnell).
Electron Tunneling, Atomic Forces, and Scanning Probe Microscopy (D. Bonnell & B. Huey).
Theory of Scanning Tunneling Microscopy (J. Tersoff).
Methods of Tunneling Spectroscopy with STM (R. Hamers & D. Padowitz).
TIPS AND SURFACES.
The Surface Structure of Crystalline Solids (W. Unertle).
The Preparation of Tips and Sample Surfaces for Scanning Probe Experiments (G. Rohrer & R. Smith).
APPLICATIONS OF SCANNING PROBE MICROSCOPY.
Electrostatic and Magnetic Force Microscopy (S. Kalinin & D. Bonnell).
BEEM and Characterization of Buried Interfaces (W. Kaiser, et al.).
The Scanning Probe Microscopy in Biology (S. Lindsay).
Nanomechanics with SPM (N. Burnham & R. Colton).
Near Field Scanning Optical Microscopy (D. Higgins & E. Mei).
Applications of Electrochemical Probe Microscopy (A. Bard & F. Fan).
Appendices.
