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· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 회로
· ISBN : 9780471476696
· 쪽수 : 368쪽
· 출판일 : 2004-03-26
목차
Foreword.
Preface.
PART I: CMOS FUNDAMENTALS.
1 Electrical Circuit Analysis.
1.1 Introduction.
1.2 Voltage and Current Laws.
1.3 Capacitors.
1.4 Diodes.
1.5 Summary.
Bibliography.
Exercises.
2 Semiconductor Physics.
2.1 Semiconductor Fundamentals.
2.2 Intrinsic and Extrinsic Semiconductors.
2.3 Carrier Transport in Semiconductors.
2.4 The pn Junction.
2.5 Biasing the pn Junction: I–V Characteristics.
2.6 Parasitics in the Diode.
2.7 Summary.
Bibliography.
Exercises.
3 MOSFET Transistors.
3.1 Principles of Operation: Long-Channel Transistors.
3.2 Threshold Voltage in MOS Transistors.
3.3 Parasitic Capacitors in MOS Transistors.
3.4 Device Scaling: Short-Channel MOS Transistors.
3.5 Summary.
References.
Exercises.
4 CMOS Basic Gates.
4.1 Introduction.
4.2 The CMOS Inverter.
4.3 NAND Gates.
4.4 NOR Gates.
4.5 CMOS Transmission Gates.
4.6 Summary.
Bibliography.
Exercises.
5 CMOS Basic Circuits.
5.1 Combinational logic.
5.2 Sequential Logic.
5.3 Input–Output (I/O) Circuitry.
5.4 Summary.
References.
Exercises.
PART II FAILURE MODES, DEFECTS, AND TESTING OF CMOS Ics.
6 Failure Mechanisms in CMOS IC Materials.
6.1 Introduction.
6.2 Materials Science of IC Metals.
6.3 Metal Failure Modes.
6.4 Oxide Failure Modes.
6.5 Conclusion.
Acknowledgments.
Bibliography.
Exercises.
7 Bridging Defects.
7.1 Introduction.
7.2 Bridges in ICs: Critical Resistance and Modeling.
7.3 Gate Oxide Shorts (GOS).
7.4 Bridges in Combinational Circuits.
7.5 Bridges in Sequential Circuits.
7.6 Bridging Faults and Technology Scaling.
7.7 Conclusion.
References.
Exercises.
8 Open Defects.
8.1 Introduction.
8.2 Modeling Floating Nodes in ICs.
8.3 Open Defect Classes.
8.4 Summary.
References.
Exercises.
9 Parametric Failures.
9.1 Introduction.
9.2 Intrinsic Parametric Failures.
9.3 Intrinsic Parametric Failure Impact on IC Behavior.
9.4 Extrinsic Parametric Failure.
9.5 Conclusion.
References.
Exercises.
10 Defect-Based Testing.
10.1 Introduction.
10.2 Digital IC Testing: The Basics.
10.3 Design for Test.
10.4 Defect-Based Testing (DBT).
10.5 Testing Nanometer ICs.
10.6 Conclusions.
Bibliography.
References.
Exercises.
Appendix A: Solutions to Self-Exercises.
A.1 Chapter 1.
A.2 Chapter 3.
A.3 Chapter 4.
A.4 Chapter 5.
A.5 Chapter 6.
A.6 Chapter 7.
A.8 Chapter 8.
A.8 Chapter 10.
Index.
About the Authors.
