책 이미지
책 정보
· 제목 : Built in Test for VLSI: Pseudorandom Techniques (Hardcover) 
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 일반
· ISBN : 9780471624639
· 쪽수 : 368쪽
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 일반
· ISBN : 9780471624639
· 쪽수 : 368쪽
목차
Digital Testing and the Need for Testable Design.
Principles of Testable Design.
Pseudorandom Sequence Generators.
Test Response Compression Techniques.
Shift-Register Polynomial Division.
Special-Purpose Shift-Register Circuits.
Random Pattern Built-In Test.
Built-In Test Structures.
Limitations and Other Concerns of Random Pattern Testing.
Test System Requirements for Built-In Test.
Appendix.
References.
Index.
추천도서
분야의 베스트셀러 >