Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits (Hardcover, Corrected 2002.)

Preface. About the Authors. I: Introduction to Testing. 1. Introduction. 2. VLSI Testing Process and Test Equipment. 3. Test Economics and Product Quality. 4. Fault Modeling. II: Test Methods. 5. Logic and Fault Simulation. 6. Testability Measures. 7. Combinational Circuit Test Generation. 8. Sequential Circuit Test Generation. 9. Memory Test. 10. DSP-Based Analog and Mixed-Signal Test. 11. Model-Based Analog and Mixed-Signal Test. 12. Delay Test. 13. IDDQ Test. III: Design for Testability. 14. Digital DFT and Scan Design. 15. Built-In Self-Test. 16. Boundary Scan Standard. 17. Analog Test Bus Standard. 18. System Test and Core-Based Design. 19. The Future of Testing. A: Cyclic Redundancy Code Theory. B: Primitive Polynomials of Degree 1 to 100. C: Books on Testing. Bibliography. Index.