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· 제목 : Delay Fault Testing for Vlsi Circuits (Hardcover) 
· 분류 : 외국도서 > 컴퓨터 > 로직 설계
· ISBN : 9780792382959
· 쪽수 : 191쪽
· 출판일 : 1998-10-31
· 분류 : 외국도서 > 컴퓨터 > 로직 설계
· ISBN : 9780792382959
· 쪽수 : 191쪽
· 출판일 : 1998-10-31
목차
Foreword. Preface. 1. Introduction. 2. Test Application Schemes for Testing Delay Defects. 3. Delay Fault Models. 4. Case Studies on Delay Testing. 5. Path Delay Fault Classification. 6. Delay Fault Simulation. 7. Test Generation for Path Delay Faults. 8. Design for Delay Fault Testability. 9. Synthesis for Delay Fault Testability. 10. Conclusions and Future Work. References. Index.
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