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· 분류 : 외국도서 > 언어학 > 언어교육
· ISBN : 9781138785519
· 쪽수 : 262쪽
· 출판일 : 2014-11-28
목차
Introduction and Overview by Antony John Kunnan and Nick Saville 1. The Story Behind the Modern Language Aptitude Test: An Interview with John B. Carroll (1916-2003) by Charles W. Stansfield & Daniel J. Reed 2. Biasing for the Best in Language Testing and Learning: An Interview with Merrill Swain by Janna Fox 3. 40 Years in Applied Linguistics: An Interview with Alan Davies by Antony John Kunnan 4. An Interview with John Trim at 80 5. People and Events in Language Testing: A Sort of Memoir. An Interview with Bernard Spolsky by Nick Saville & Antony John Kunnann 6. An Interview with Professor Kenji Ohtomo: The Founding Father of Language Testing in Japan by Miyoko Kobayashi & Masashi Negishi 7. A Life in Language Testing: An Interview with Charles Stansfield by Daniel J. Reed & Melissa Bowles 8. From Cloze to Consequences and Beyond: An Interview with Elana Shohamy by Anne Lazaraton 9. Gui Shichuan: Founding Father of Language Testing in China. An interview by He Lianzhen & Qi Luxia 10. Language Assessment: Its Development and Future - An Interview with Lyle F. Bachman by Jing Chen 11. A lifetime of language testing: An interview with J. Charles Alderson by Tineke Brunfaut 12. Liz Hamp-Lyons: An interview by Jin Yan















