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· 분류 : 외국도서 > 기술공학 > 기술공학 > 전기공학
· ISBN : 9781402056451
· 쪽수 : 269쪽
· 출판일 : 2007-06-04
목차
1- Space Radiation Environment, J.-C. Boudenot (THALES) 2- Radiation Effects in Microelectronics, R. Schrimpf (Vanderbilt Univ. ) 3- In-Flight Anomalies on Electronic Devices, R. Ecoffet (CNES) 4- Multi-Level Fault Effects Evaluation, L. Anghel (TIMA), M. Rebaudengo, M. Sonza Reorda, M. Violante (POLI Torino) 5- Effects of Radiation on Analog & Mixed-Signal Circuits, M. Lubaszewski, T. Balen, E. Schuler, L.Carro (UFRGS), J.L. Huertas (IMSE-CNM) 6- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing , P. Fouillat, V. Pouget (IXL), D. McMorrow (NRL). F. Darracq (IXL), S. Buchner (QSS), D. Lewis (IXL) 7- Design Hardening Methodologies for ASICs , F. Faccio (CERN) 8- Fault Tolerance in Programmable Circuits, F. Kastensmidt (UFRGS) & R. Reis (UFRGS) 9- Automatic Tools for Design Hardening, C. Lopez-Ongill, L. Entrena, M. Gracia-Valderas, M. Portela-Garcia (Univ. Carlos III) 10- Test Facilities for SEE and Dose Testing, S. Duzellier (ONERA) and G. Berger (UCL) 11- Error Rate Prediction of Digital Architectures: Test Methodology and Tools, R. Velazco, F, Faure (TIMA) 12- Using the SEEM Software for Laser SET Testing and Analysis, V. Pouget, P. Fouillat, D. Lewis (IXL)














