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· 제목 : A Designer's Guide to Built-In Self-Test (Hardcover, 2002) 
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 일반
· ISBN : 9781402070501
· 쪽수 : 320쪽
· 출판일 : 2002-05-31
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 일반
· ISBN : 9781402070501
· 쪽수 : 320쪽
· 출판일 : 2002-05-31
목차
Preface. About the Author. 1. An Overview of BIST. 2. Fault Models, Detection, and Simulation. 3. Design for Testability. 4. Test Pattern Generation. 5. Output Response Analysis. 6. Manufacturing and System-Level Use of BIST. 7. Built-In Logic Block Observer. 8. Pseudo-Exhaustive BIST. 9. Circular BIST. 10. Scan-Based BIST. 11. Non-Intrusive BIST. 12. BIST for Regular Structures. 13. BIST for FPGAs and CPLDs. 14. Applying Digital BIST of Mixed-Signal Systems. 15. Merging BIST and Concurrent Fault Detection. Acronyms. Bibliography. Index.
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