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· 제목 : High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Hardcover, 2003) (Design Principles, Fault Modeling and Self-Test)
· 분류 : 외국도서 > 컴퓨터 > 컴퓨터 엔지니어링
· ISBN : 9781402072550
· 쪽수 : 250쪽
· 분류 : 외국도서 > 컴퓨터 > 컴퓨터 엔지니어링
· ISBN : 9781402072550
· 쪽수 : 250쪽
목차
Preface. Section I: Design & Test of Memories. 1. Opening Pandora's Box. 2. Static Random Access Memories. 3. Multi-Port Memories. 4. Silicon On Insulator Memories. 5. Content Addressable Memories. 6. Dynamic Random Access Memories. 7. Non-Volatile Memories. Testing II: Memory Testing. 8. Memory Faults. 9. Memory Patterns. Section III: Memory Self Test. 10. BIST Concepts. 11. State Machine BIST. 12. Micro-Code BIST. 13. BIST and Redundancy. 14. Design For Test and BIST. 15. Conclusions. Appendices. Appendix A. Further Memory Fault Modeling. Appendix B. Further Memory Test Patterns. Appendix C. State Machine HDL. References. Glossary/Acronyms. Index. About the Author.
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