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· 분류 : 외국도서 > 기술공학 > 기술공학 > 재료과학
· ISBN : 9781420042948
· 쪽수 : 342쪽
· 출판일 : 2008-12-01
목차
Preface
Introduction
Contact Angle in Surface Analysis
Measuring Contact Angle
Determining Surface Energy of a Homogeneous Solid Surface
Work Examples
X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Atomic Model and Electron Configuration
Principles of XPS and AES
Instrumentation
Routine Limits of XPS
XPS Applications and Case Studies
AES Applications
Scanning Tunneling Microscopy and Atomic Force Microscopy
Working Principle
Instrumentation
Modes of Operation
Differences between STM and AFM
Applications
X-ray Diffraction
X-ray Characteristics and Generation
Lattice Planes and Bragg’s Law
Powder Diffraction
Thin Film Diffraction
Texture Measurement
Grazing Angle X-ray Diffraction
Transmission Electron Microscopy
Basics of Transmission Electron Microscopes
Reciprocal Lattice
Specimen Preparation
Bright-Field and Dark-Field Images
Electron Energy Loss Spectroscopy
Scanning Electron Microscopy
Introduction to Scanning Electron Microscopes
Electron Beam?Specimen Interaction
SEM Operating Parameters
Applications
Chromatographic Methods
General Principles of Chromatography
Ion Exchange Chromatography
Gel Permeation Chromatography
Gel Electrophoresis Chromatography
High-Performance Liquid Chromatography
Gas Chromatography
Quantitative Analysis Methods
Infrared Spectroscopy and UV/Vis Spectroscopy
Infrared Radiation Spectroscopy
Ultraviolet/Visible Spectroscopy
Macro and Micro Thermal Analyses
Macro and Micro Differential Scanning Calorimetry
Isothermal Titration Calorimetry
Thermogravimetric Analysis
Laser Confocal Fluorescence Microscopy
Fluorescence and Fluorescent Dyes
Fluorescence Microscopy
Laser Confocal Fluorescence Microscopy
Applications of LCFM
Index
