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Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11

Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11 (Paperback, Softcover Repri)

Gavin R. Mallett, John B. Newkirk, Heinz G. Pfeiffer (지은이)
Springer Verlag
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Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
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· 제목 : Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11 (Paperback, Softcover Repri) 
· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 화학 > 물리화학
· ISBN : 9781468486780
· 쪽수 : 499쪽
· 출판일 : 2013-10-10

목차

Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques.- X-Ray Fluorescence Spectroscopy in the Analysis of Ores, Minerals, and Waters.- Common Sources of Error in Electron Probe Microanalysis.- X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques.- Theoretical Correction for Coexistent Elements in Fluorescent X-Ray Analysis of Alloy Steel.- Micro Fluorescent X-Ray Analyzer.- Use of Primary Filters in X-Ray Spectrography: A New Method for Trace Analysis.- Precision and Accuracy of Silicate Analyses by X-Ray Fluorescence.- Applications of Computerized Statistical Techniques in Quantitative X-Ray Analysis.- X-Ray Fluorescence Analysis of a Manganese Ore.- Total Nondestructive Analysis of CAAS Syenite.- X-Ray Fluorescence of Suspended Particles in a Liquid Hydrocarbon.- The Effect of Surface Roughness in Polymers on X-Ray Fluorescence Intensity Measurements.- Production Control of Gold and Rhodium Plating Thickness on Very Small Samples by X-Ray Spectroscopy.- A Study of X-Ray Fluorescence Method with Vacuum and Air-Path Spectrographs for the Determination of Film Thicknesses of II-VI Compounds.- Rare-Earth Analyses by X-Ray-Excited Optical Fluorescence.- Nondispersive X-Ray Fluorescent Spectrometer.- The Influence of Sample Self-Absorption on Wavelength Shifts and Shape Changes in the Soft X-Ray Region: The Rare-Earth M Series.- The X-Ray Wavelength Scale in the Long-Wavelength Region.- Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys.- The Application of Radioisotope Nondispersive X-Ray Spectrometry to the Analysis of Molybdenum.- Quantitative Microprobe Analysis of Thin Insulating Films.- The Effect of Microsegregation on the Observed Intensity in Thin-Film Microanalysis.- Multistep Intensity Indication in Scanning Microanalysis.- Investigation and Demonstration of Single-Crystal and Powder Diffraction by Using Zero-Power Beta-Excited X-Ray and 55Fe Isotopic Sources.- An X-Ray Small-Angle Scattering Instrument.- Study of Extended X-Ray Absorption Fine Structure with the Use of Thick Targets.- Determination of Lattice Parameters by the Kossel and Divergent X-Ray Beam Techniques.- Fully Automated High-Precision X-Ray Diffraction.- Computerized Multiphase X-Ray Powder-Diffraction Identification System.- Measurement of Elastic Strains in Crystal Surfaces by X-Ray Diffraction Topography.- X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals.- X-Ray Stress Measurement by the Single-Exposure Technique.- Residual Stress and Shape Distortion in High-Strength Tool Steels.- Irradiation Effects in Some Crystalline Ceramics.- An X-Ray Diffraction Study of the Aging Reaction in Two Austenitic Alloys.- A Simplified Method of Quantitating Preferred Orientation.- Crystallite Orientation Analysis for Rolled Cubic Materials.- Topotactical Relationships Between Hematite ?-Fe2O3 and the Magnetite Fe3O4 Which is Formed on It by Thermal Decomposition under Low Oxygen Pressure.- Crystal Structure Analysis of Niobium-Doped Rutile Single Crystal.- Author Index.

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