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· 제목 : Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Hardcover, 2005) (A Method of Defect Characterization in Silicon for Photovoltaic Applications)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 광학
· ISBN : 9783540253037
· 쪽수 : 492쪽
· 출판일 : 2005-06-23
· 분류 : 외국도서 > 기술공학 > 기술공학 > 광학
· ISBN : 9783540253037
· 쪽수 : 492쪽
· 출판일 : 2005-06-23
목차
Theory of carrier lifetime in silicon.- Lifetime measurement techniques.- Theory of lifetime spectroscopy.- Defect characterization on intentionally metal-contaminated silicon samples.- The metastable defect in boron-doped Czochralski silicon.- Summary and further work.- Zusammenfassung und Ausblick.
