Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (Hardcover)

Higher Harmonics in Dynamic Atomic Force Microscopy.- Atomic Force Acoustic Microscopy.- Scanning Ion Conductance Microscopy.- Spin-Polarized Scanning Tunneling Microscopy.- Dynamic Force Microscopy and Spectroscopy.- Sensor Technology for Scanning Probe Microscopy and New Applications.- Quantitative Nanomechanical Measurements in Biology.- Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale.- Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices.- Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures.- Focused Ion Beam as a Scanning Probe: Methods and Applications.