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· 제목 : On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond (Hardcover)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > Solid State
· ISBN : 9788770221122
· 쪽수 : 278쪽
· 출판일 : 2019-07-31
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > Solid State
· ISBN : 9788770221122
· 쪽수 : 278쪽
· 출판일 : 2019-07-31
목차
- Preface;
- 1. Motivation;
- 2. Introduction;
- 3. Development of Calibration Solutions;
- 4. Design of on-Wafer Calibration Standards;
- 5. Electrical Properties of Custom Standards;
- 6. Verification Methods for on-Wafer Calibration;
- 7. Advantages of in-situ Calibration;
- 8. Addressing Issues of on-Wafer Standards;
- 9. Selected Aspects of Measurement and Calibration Assurance;
- 10. Conclusion and Further Research;
- 11. Attachments;
- 12. Bibliography;
- Keyword Index.
