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· 제목 : Advances in Imaging and Electron Physics: Volume 171 (Hardcover)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 마이크로 일렉트로닉스
· ISBN : 9780123942975
· 쪽수 : 440쪽
· 출판일 : 2012-05-15
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 마이크로 일렉트로닉스
· ISBN : 9780123942975
· 쪽수 : 440쪽
· 출판일 : 2012-05-15
목차
- Derivation of the Reflection Equations for Higher Order Aberrations of Local Wavefronts by Oblique Incidence
- Thermal Imaging in Medicine
- Derivation of the Radiative Transfer Equation in a Medium with a Spatially Varying Refractive Index: A Review
- Imaging Mass Spectrometry ? Sample Preparation, Instrumentation and Applications
- Transformation Optics
- TSEM - A Review of Scanning Electron Microscopy in Transmission Mode and Its Applications
- Logarithmic Image Processing: Additive Contrast, Multiplicative Contrast and Associated Metrics
G. Esser, W. Becken, W. Muller, P. Baumbach, J. Arasa, D. Uttenweiler
Lila Iznita Izhar and Maria Petrou
Jean-Michel Tualle
Kamlesh Shrivas and Mitsutoshi Setou
Robert T. Thompson and Steven A. Cummer
Tobias Klein, Egbert Buhr and Carl Georg Frase
M. Jourlina, M. Carr´e, J. Breugnot and M. Bouabdellah
