책 이미지
eBook 미리보기
책 정보
· 제목 : Ionizing Radiation Effects in Mos Devices and Circuits (Hardcover)
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 반도체
· ISBN : 9780471848936
· 쪽수 : 608쪽
· 출판일 : 1989-04-18
· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 반도체
· ISBN : 9780471848936
· 쪽수 : 608쪽
· 출판일 : 1989-04-18
목차
Historical Perspective (H. Hughes).
Electron-Hole Generation, Transport, and Trapping in SiO2 (F. McLean, et al.).
Radiation-Induced Interface Traps (P. Winokur).
Radiation Effects on MOS Devices and Circuits (P. Dressendorfer).
Radiation-Hardening Technology (P. Dressendorfer).
Process-Induced Radiation Effects (T. Ma).
Source Considerations and Testing Techniques (K. Kerris).
Transient-Ionization and Single-Event Phenomena (S. Kerns).
Index.
