Testing of Digital Systems (Hardcover)

1. Introduction; 2. Fault models; 3. Combinational logic and fault simulation; 4. Test generation for combinational circuits; 5. Sequential ATPG; 6. IDDQ testing; 7. Functional testing; 8. Delay fault testing; 9. CMOS testing; 10. Fault diagnosis; 11. Design for testability; 12. Built-in self-test; 13. Synthesis for testability; 14. Memory testing; 15. High-level test synthesis; 16. System-on-a-chip testing; Index.