Testing and Reliable Design of CMOS Circuits (Paperback, Softcover Repri)

1. Introduction.- 1.1 What is Testing ?.- 1.2 Faults and Errors.- 1.3 Different Types of CMOS Circuits.- 1.3.1 Static CMOS Circuits.- 1.3.2 Dynamic CMOS Circuits.- 1.4 Gate-Level Model.- 1.5 Fault Models.- 1.5.1 Stuck-at Fault Model.- 1.5.2 Stuck-open Fault Model.- 1.5.3 Stuck-on Fault Model.- 1.5.4 Bridging Fault Model.- 1.5.5 Delay Fault Model.- References.- Problems.- 2. Test Invalidation.- 2.1 The Test Invalidation Problem.- 2.1.1 Test Invalidation due to Circuit Delays.- 2.1.2 Test Invalidation due to Charge Sharing.- 2.2 Robust Testability of Dynamic CMOS Circuits.- References.- Additional Reading.- Problems.- 3. Test Generation for Dynamic CMOS Circuits.- 3.1 Path Sensitization and D-Algorithm.- 3.2 Boolean Difference.- 3.3 Fault Collapsing.- 3.4 Redundancy in Circuits.- 3.5 Testing of Domino CMOS Circuits.- 3.5.1 Testing of Gates with Series-Parallel Network.- 3.5.2 Testing of Gates with Non-Series-Parallel Network.- 3.5.3 Testing of a General Circuit.- 3.5.4 Ordering of Test.- 3.6 Testing of CVS Circuits.- References.- Additional Reading.- Problems.- 4. Test Generation for Static CMOS Circuits.- 4.1 Non-Robust Test Generation.- 4.1.1 Test Generation from a Gate-Level Model.- 4.1.1.1 The Jain-Agrawal Method.- 4.1.1.2 The Reddy-Agrawal-Jain Method.- 4.1.1.3 The Chandramouli Method.- 4.1.2 Test Generation at the Switch Level.- 4.1.2.1 The Chiang-Vranesic Method.- 4.1.2.2 The Agrawal-Reddy Method.- 4.1.2.3 The Shih-Abraham Method.- 4.2 Robust Test Generation.- 4.2.1 The Reddy-Reddy-Agrawal Method.- 4.2.2 Some Issues in Robust Test Generation.- References.- Additional Reading.- Problems.- 5. Design for Robust Testability.- 5.1 Testable Designs Using Extra Inputs.- 5.1.1 The Reddy-Reddy-Kuhl Method.- 5.1.2 The Liu-McCluskey Method.- 5.2 Testable Designs Using Complex Gates.- 5.3 Testable Designs Using Parity Gates.- 5.4 Testable Designs Using Shannon's Theorem.- 5.4.1 Path Delay Faults.- 5.4.2 Robustly Testable Design.- References.- Additional Reading.- Problems.- 6. Self-Checking Circuits.- 6.1 Concepts and Definitions.- 6.2 Error-Detecting Codes.- 6.2.1 Codes for Detecting All Unidirectional Errors.- 6.2.2 t-Unidirectional Error-Detecting Codes.- 6.2.3 t-Burst Unidirectional Error-Detecting Codes.- 6.3 Self-Checking Checkers.- 6.3.1 Static vs Dynamic CMOS Implementations.- 6.3.2 Two-Rail Checkers.- 6.3.3 Parity Checkers.- 6.3.4 m-out-of-n Checkers.- 6.3.5 Berger Checkers.- 6.3.6 Checkers for Borden, Bose-Lin, Bose and Blaum Codes.- 6.3.7 Embedded Checker Problem.- 6.4 Self-Checking Functional Circuits.- References.- Additional Reading.- Problems.- 7. Conclusions.- References.