Integrated Circuit Manufacturability: The Art of Process and Design Integration (Hardcover)

Preface.

Introduction (Jose Pineda de Gyvez).

Defect Monitoring and Characterization (Eric Bruls).

Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev).

Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue).

Critical Area and Fault Probability Prediction (D.M.H. Walker).

Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski).

Architectural Fault Tolerance (S.K. Tewksbury).

Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh).

Testing Solutions for MCM Manufacturing (Yervant Zorian).

Index.

About the Editors.