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· 분류 : 외국도서 > 기술공학 > 기술공학 > 전자공학 > 회로
· ISBN : 9781482254624
· 쪽수 : 644쪽
· 출판일 : 2016-04-26
목차
INTRODUCTION
Overview
Luciano Lavagno, Grant E. Martin, Louis K. Scheffer, and Igor L. Markov
Integrated Circuit Design Process and Electronic Design Automation
Robert Damiano, Raul Camposano, and Grant E. Martin
Tools and Methodologies for System-Level Design
Shuvra Bhattacharyya and Marilyn Wolf
System-Level Specification and Modeling Languages
Stephen A. Edwards and Joseph T. Buck
SoC Block-Based Design and IP Assembly
Yaron Kashai
Performance Evaluation Methods for Multiprocessor System-on-Chip Design
Ahmed Jerraya and Iuliana Bacivarov
System-Level Power Management
Naehyuck Chang, Enrico Macii, Massimo Poncino, and Vivek Tiwari
Processor Modeling and Design Tools
Anupam Chattopadhyay, Nikil Dutt, Rainer Leupers, and Prabhat Mishra
Models and Tools for Complex Embedded Software and Systems
Marco Di Natale
SYSTEM-LEVEL DESIGN
Using Performance Metrics to Select Microprocessor Cores for IC Designs
Steve Leibson
High-Level Synthesis
Felice Balarin, Alex Kondratyev, and Yosinori Watanabe
MICROARCHITECTURE DESIGN
Back-Annotating System-Level Models
Miltos D. Grammatikakis, Antonis Papagrigoriou, Polydoros Petrakis, and Marcello Coppola
Microarchitectural and System-Level Power Estimation and Optimization
Enrico Macii, Renu Mehra, Massimo Poncino, and Robert P. Dick
Design Planning
Ralph H.J.M. Otten
Design and Verification Languages
Stephen A. Edwards
Digital Simulation
John Sanguinetti
Leveraging Transaction-Level Models in an SoC Design Flow
Laurent Maillet-Contoz, Jerome Cornet, Alain Clouard, Eric Paire, Antoine Perrin, and Jean-Philippe Strassen
LOGIC VERIFICATION
Assertion-Based Verification
Harry Foster and Erich Marschner
Hardware-Assisted Verification and Software Development
Frank Schirrmeister, Mike Bershteyn, and Ray Turner
Formal Property Verification
Limor Fix, Ken McMillan, Norris Ip, and Leopold Haller
TEST
Design-for-Test
Bernd Koenemann and Brion Keller
Automatic Test Pattern Generation
Kwang-Ting (Tim) Cheng, Li-C. Wang, Huawei Li, and James Chien-Mo Li
Analog and Mixed-Signal Test
Haralampos-G. Stratigopoulos and Bozena Kaminska
