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· 제목 : Interconnect Reliability in Advanced Memory Device Packaging (Paperback, 2023) 
· 분류 : 외국도서 > 컴퓨터 > 하드웨어 > 일반
· ISBN : 9783031267109
· 쪽수 : 210쪽
· 출판일 : 2024-04-30
· 분류 : 외국도서 > 컴퓨터 > 하드웨어 > 일반
· ISBN : 9783031267109
· 쪽수 : 210쪽
· 출판일 : 2024-04-30
목차
Chapter 1: Advanced Memory and Device Packaging.- Chapter 2: Wearout Reliability-based Characterization in Memory Packaging.- Chapter 3: Recycling of Noble Metals Used in Memory Packaging.- Chapter 4: Advanced Flip Chip Packaging.- Chapter 5: Second Level Interconnect Reliability of Low Temperature Solder Materials Used in Memory Modules and Solid-State Drives (SSD).- Chapter 6: Specific Packaging Reliability Testing.- Chapter 7: Reliability Simulation and Modeling in Memory Packaging.- Chapter 8: Interconnects Reliability for Future Cryogenic Memory Applications.
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