Atomic Force Microscopy : Fundamental Concepts and Laboratory Investigations (Hardcover)

Preface Acknowledgements Chapter 1. Introduction to Atomic Force Microscopy 1.0 ? Key Objectives 1.1 ? Scanning Probe Microscope Overview 1.2 ? AFM Description 1.2.1 ? AFM Components 1.3 ? Basic AFM Operation 1.3.1 ? AFM Modes 1.3.2 ? Feedback Electronics 1.3.3 ? Laser Beam Detection 1.4 ? Forces in AFM 1.5 ? AFM Applications 1.6 ? AFM Lithography 1.6.1 ? Nanoshaving 1.6.2 ? Nanografting 1.6.3 ? Dip-Pen Nanolithography (DPN) 1.7 ? End-of-Chapter Questions 1.8 ? References Chapter 2. Tip ? Sample Forces 2.0 ? Key Objectives 2.1 ? Introduction 2.2 ? Van der Waals Forces 2.3 ? Repulsive Forces 2.4 ? Capillary Forces 2.5 ? Force Curves 2.5.1 ? Force Spectroscopy 2.6 ? Laboratory Exercise: Force Curve Analysis of Metallized Polymer Patterns 2.6.1 ? Laboratory Objectives 2.6.2 ? Materials and Procedures 2.6.3 ? Sample Data and Results 2.7 ? Post-Lab Questions 2.8 ? End-of-Chapter Questions 2.9 ? References Chapter 3. ? AFM Electronics 3.0 ? Key Objectives 3.1 ? Analog and Digital Electronics 3.2 ? AFM Components 3.2.1 ? Photodiode 3.2.2 ? Scanner 3.2.2.1 ? Scanner Materials 3.2.2.2 ? Piezotube Geometry 3.2.2.3 ? Scanner Nonlinearities 3.2.3 ? Motors 3.3 ? Feedback Loop 3.3.1 ? Proportional and Integral Gains 3.4 ? AFM Parameters 3.5 ? End-of-Chapter Questions 3.6 ? References Chapter 4. ? AFM Cantilevers and Probes 4.0 ? Key Objectives 4.1 ? Probe Characteristics 4.2 ? Tip Geometry 4.3 ? Cantilever Characteristics 4.4 ? Mechanical Properties of Cantilevers 4.4.1 ? Spring Constants 4.4.2 ? Resonance Frequency of Cantilever 4.5 ? Probe Fabrication 4.6 ? End-of-Chapter Questions 4.7 ? References Chapter 5. Contact Mode AFM 5.0 ? Key Objectives 5.1 ? Contact Mode Characteristics 5.1.1 ? Contact Mode Applications 5.2 ? Probe Behavior in Contact Mode 5.3 ? Feedback Loop Operation in Contact Mode 5.3.1 ? Setpoint 5.3.2 ? Deflection 5.3.3 ? Feedback Loop Signals 5.4 ? Surface Roughness 5.4.1 ? Average Roughness 5.4.2 ? RMS Roughness 5.4.3 ? Additional Roughness Parameters 5.5 ? Laboratory Exercise: Surface Roughness Analysis of Metallized Polymer Patterns 5.5.1 ? Laboratory Objectives 5.5.2 ? Materials and Procedures 5.5.3 ? Sample Data 5.6 ? Post-Lab Question 5.7 ? End-of-Chapter Questions 5.8 ? References Chapter 6. Lateral Force Microscopy 6.0 ? Key Objectives 6.1 ? Introduction 6.2 ? Lateral Force Microscope Probe Behavior 6.3 ? Lateral Force Microscopy Data 6.3.1 ? Photodiode Response in Lateral Force Microscopy 6.3.2 ? Friction Loop 6.4 ? Laboratory Exercise: Analysis of Nanoshaved Patterns Etched in Polymer Films 6.4.1 ? Laboratory Objectives 6.4.2 ? Materials and Procedures 6.4.3 ? Sample Data and Results 6.5 ? Post-Lab Questions 6.6 ? End-of-Chapter Questions 6.7 ? References Chapter 7. Conductive Atomic Force Microscopy 7.0 ? Key Objectives 7.1 ? CAFM Overview 7.2 ? CAFM Electronics 7.3 ? CAFM Probe Characteristics 7.4 ? Nanoscale Impedance Microscopy 7.4.1 ? Nanoscale Impedance Microscopy Data 7.5 ? Laboratory Exercise: CAFM Analysis of Silver Nanowires 7.5.1 ? Laboratory Objectives 7.5.2 ? Materials and Procedures 7.5.3 ? Sample Data 7.6 ? Post-Lab Questions 7.7 ? End-of-Chapter Questions 7.8 ? References Chapter 8. Oscillating Modes of AFM 8.0 ? Key Objectives 8.1 ? Tapping Mode 8.1.1 ? Tapping Mode Operation 8.1.2 ? Mechanical Properties of Tapping Mode Tips 8.1.3 ? Tapping Mode Forces 8.1.4 ? Tapping Mode Parameters 8.1.5 ? Q ?Factor 8.1.6 ? Feedback Loop Operation in Oscillating Modes 8.1.7 ? Lock-in Amplifier 8.2 ? Non-contact Mode 8.2.1 ? Non-contact Mode Forces 8.3 ? Phase Imaging 8.4 ? Laboratory Exercise: Phase Imaging of Metal/Polymer Nanostructures 8.4.1 ? Laboratory Objectives 8.4.2 ? Materials and Procedures 8.4.3 ? Sample Data and Results 8.5 ? Post-Lab Questions 8.6 ? End-of-Chapter Questions 8.7 ? References Chapter 9. Image Processing 9.0 ? Key Objectives 9.1 ? Introduction 9.2 ? Levelling 9.2.1 ? Polynomial Fitting 9.3 ? Histogram Adjust 9.4 ? Filtering 9.4.1 ? External Vibrations 9.4.2 ? Fast Fourier Transform 9.5 ? Line Profiles 9.6 ? End-of-Chapter Questions 9.7 - References