책 이미지
eBook 미리보기
책 정보
· 제목 : High Resolution X-Ray Diffractometry and Topography (Hardcover)
· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 과학일반
· ISBN : 9780850667585
· 쪽수 : 264쪽
· 출판일 : 1998-02-05
· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 과학일반
· ISBN : 9780850667585
· 쪽수 : 264쪽
· 출판일 : 1998-02-05
목차
Introduction- diffraction studies of crystal perfection; high resolution X- ray diffraction techniques; analysis of expitaxial layers; X-ray scattering theory; simulation of X-ray diffraction rocking curves; analysis of thin films and multiple layers; triple axis X-ray diffractometry; single crystal X-ray topography; double crystal X-ray topography; synchrotron radiation topography.
