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· 제목 : Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions (Paperback)
· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 화학 > 화학 일반
· ISBN : 9781032375113
· 쪽수 : 144쪽
· 출판일 : 2024-11-29
· 분류 : 외국도서 > 과학/수학/생태 > 과학 > 화학 > 화학 일반
· ISBN : 9781032375113
· 쪽수 : 144쪽
· 출판일 : 2024-11-29
목차
1.Introduction to material characterization 2. X-Ray Diffraction (XRD) 3. Nanomechanical system 4. X-Ray photo spectroscopy (XPS) 5. Scanning electron microscope (SEM) 6. Field emission scanning electron microscope (FESEM) 7. Transmission electron microscope (TEM) 8. Atomic Force Microscope (AFM) 9. Near-field scanning optical microscope Raman 10. Optical characterization instruments 11. Synchrotron techniques 12. Other advanced instruments used for characterization of functionally graded materials
