Progress in Transmission Electron Microscopy 2: Applications in Materials Science (Hardcover, 2001)

From the contents: - The Guidance Role of HRTEM in Developing Mesoporous Molecular Sieves - HREM Study of Carbon Nanoclusters Grown from Carbon Arc-Discharge - Determining the Helicity of Carbon Nanotubes by Electron Diffraction - Low-Dimensional Materials and their Microstructures Studied by High-Resolution Electron Microscopy - Microstructure of High-Tc Superconducting Josephson Junctions - Swift Heavy Ion Irradiation Damage in Superconductors - TEM Investigations of Misfit Dislocations in Lattice-Mismatched Semiconductor Heterostructures - Dislocated Contrast Analysis - Transmission Electron Cryomicroscopy and Three-Dimensional Reconstruction of Macromolecular Complexes