Optical Techniques for Solid-State Materials Characterization (Paperback, 1)

BACKGROUND: Light-Matter Interactions. Semiconductors and Their Nanostructures. The Optical Properties of Metals: From Wideband to Narrowband Materials. LINEAR OPTICAL SPECTROSCOPY: Methods for Obtaining the Optical Constants of a Material. Methods for Obtaining the Optical Response after CW Excitation. Raman Scattering as a Tool for Studying Complex Materials. TIME-RESOLVED OPTICAL SPECTROSCOPY: Ultrashort Pulse Generation and Measurement. Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation. Ultrafast Pump-Probe Spectroscopy. Transient Four-Wave Mixing. Time-Domain and Ultrafast Terahertz Spectroscopy. Time-Resolved Photoluminescence Spectroscopy. Time-Resolved Magneto-Optical Spectroscopy. Time-Resolved Raman Scattering. SPATIALLY RESOLVED OPTICAL SPECTROSCOPY: Microscopy. Micro-Optical Techniques. Near-Field Scanning Optical Microscopy. RECENT DEVELOPMENTS: Recent Developments in Spatially and Temporally Resolved Optical Characterization of Solid-State Materials. Index.