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· 제목 : Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Hardcover)
· 분류 : 외국도서 > 과학/수학/생태 > 수학 > 계산
· ISBN : 9780857293091
· 쪽수 : 152쪽
· 출판일 : 2011-03-07
· 분류 : 외국도서 > 과학/수학/생태 > 수학 > 계산
· ISBN : 9780857293091
· 쪽수 : 152쪽
· 출판일 : 2011-03-07
목차
1. Introduction.- 2. Development of Physics-based Modeling for ULSI Interconnections Failure Mechanisms: Electromigration and Stress Induced Voiding.- 3. Introduction and General Theory of Finite Element Method.- 4. Finite Element Method for Electromigration Study.- 5. Finite Element Method for Stress Induced Voiding.- 6. Finite Element Method for Dielectric Reliability.
